Development of ISO/IEC 29119 began in May 2007 by Working Group 26 (WG26) of the ISO/IEC JTC1/SC7 Software and Systems Engineering committee. Participation in WG26 is open to anyone, through their national standards body (e.g. British Standards Institute, Standards Australia, ANSI, etc). WG26 meets twice a year (refer to the meetings page for information on dates and locations).

Software testing specialists from industry and academia who are interested in becomming members of the working group, reviewing drafts of the standard or simply being kept informed on the development progress of the standard are invited to email the convenor of our working group, Dr. Stuart Reid, at sreid@testing-solutions.com for more information.

The convenor of ISO/IEC JTC1/SC7 WG26 is:

1. Dr. Stuart Reid - British Standards Institution, United Kingdom

The co-editors of ISO/IEC 29119 Software Testing and members of WG26 are:

1. Anne Mette Haas (editor of ISO/IEC 29119-1 and 29119-3) - Delta Axiom, Denmark
2. Sylvia Veeraraghavan (editor of ISO/IEC 29119-2) - Mind Tree, India
3. Tafline Murnane (editor of ISO/IEC 29119-4) - K. J. Ross & Associates, Australia
4. Tom Wissink (product editor of ISO/IEC 29119) - IEEE, USA
5. Wonil Kwon (editor ISO/IEC 29119-1) - Software Testing Alliances, South Korea

The following people are also members of WG26:

1. Alastair Walker - SPI Lab, South Africa
2. Alphonse Philippe - Infocert, France
3. Arun Kumar Melkote - Wipro Technologies, India
4. Barbara Huisman - Quality Business Solutions, Canada
5. Cao Jing - Tianjin Software Testing Centre, China
6. Cerys Willoughby - IBM, UK
7. Chai Afeng - Tianjin Software Testing Centre, China
8. Cheong Jeong Seo - Samsung, Korea
9. Dnyanada Wagh - Patni Computer Systems, India
10. Grantham Daniels - South African Bureau of Standards, South Africa
11. Gustavo A Valencia R - GreenSQA, Columbia
12. Hack-Youp Noh - Korean Agency for Technology & Standards, Korea
13. Hareton Leung - Hong Kong Polytechnic University, Hong Kong
14. Ian Hirst - Birchgrove Technology Management Consulting, Australia
15. Ine Lutterman - Netherlands Standardization Institute, Netherlands
16. Javier Tuya - University of Oviedo, Spain
17. Jongkwan Lee - Software Testing Alliances, Korea
18. Juichi Takahashi - Sony Corporation, Japan
19. Kazuo Yabuta - Fujitsu, Japan
20. Keerthishankar K N - Wipro Technologies, India
21. Keum-Ran Lee - Software Testing Alliances, Korea
22. Klaudia Dussa-Zieger - Method Park Software AG, Germany
23. Kouichi Akiyama - Fuji Xerox, Japan
24. Liliana Gomez Arenas - Parquesoft, Colombia
25. Manikandan K. - Bureau of Indian Standards, India
26. Michael Crerar - Trusted Mission Solutions, USA
27. Moohee Han - LG Electronics, Korea
28. Ogawa Kiyoshi - Nagoya Industrial Research Institute, Japan
29. Ossi Taipale -Lappeenranta University of Technology, Finland
30. Patricia Huyos C. - Parquesoft, Columbia
31. Paula Maria Angeleri - National Standards Body of Argentina (IRAM), Argentina
32. Qin Liu - School of Software Engineering, Tongji UniversityChina
33. Radoslaw Hofman - Polsoft, Poland
34. Rolf Ziegler - SAP, Germany
35. Satomi Yoshizawa - NEC, Japan
36. Satoshi Masuda - IBM, Japan
37. Soo-yeon Lee - Korean Testing Laboratory, Korea
38. SuJin Choi - Software Testing Alliances, Korea
39. Susan Burgess - Keane, USA
40. Tan Liqin - China Electronics Standardization Institute (CESI), China
41. Thomas George - Wipro Technologies, India
42. Tim Archer - Charles Sturt University, Australia
43. Tohru Matsuodani - Hosei University, Japan
44. Ton van Bergeijk - Nederlands Normalisatie-instituut, Netherlands
45. Tsuneo Yamaura - Tokai University, Japan
46. Yasuharu Nishi - University of Electro-Communications, Japan
47. Yuji Shinoki - Hitachi, Japan
48. Yumuto Tsuyoshi - Mamezou Co, Japan

WG26 at the SC7 plenary in Niigata, Japan, May 2010

WG26 at the SC7 plenary meeting in Hyderabad, India, May 2009

Members of WG26 at the interim meeting in Seoul, South Korea, Nov 2008

Members of WG26 at the SC7 plenary in Berlin, Germany, May 2008