Development of ISO/IEC 29119 began in May 2007 by Working Group 26 (WG26) of the ISO/IEC JTC1/SC7 Software and Systems Engineering committee. Participation in WG26 is open to anyone through their national standards body (e.g. British Standards Institute, Standards Australia, ANSI, etc). WG26 meets twice a year (refer to the meetings page for information on dates and locations).

Software testing specialists from industry and academia who are interested in becoming members of the working group, reviewing drafts of the standard or simply being kept informed on the development progress of the standard are invited to email the convenor of our working group, Dr. Stuart Reid, at sreid@testing-solutions.com for more information.

The convenor of ISO/IEC JTC1/SC7 WG26 is:

1. Dr. Stuart Reid - British Standards Institution, United Kingdom

The co-editors of ISO/IEC 29119 Software Testing and members of WG26 are:

1. Anne Mette Haas (editor of 29119-3) - Devo Team, Denmark
2. Jon Hagar (product editor of ISO/IEC 29119) - Lockheed Martin, USA
3. Matt Mansell (editor of ISO/IEC 29119-1) - Department of Internal Affairs, New Zealand
4. Sylvia Veeraraghavan (editor of ISO/IEC 29119-2) - Mind Tree, India
5. Tafline Murnane (editor of ISO/IEC 29119-4) - K. J. Ross & Associates, Australia
6. Wonil Kwon (ISO/IEC 33063 Process Assessment Model for Software testing processes) - Software Testing Alliances, South Korea

The following are current members of WG26:

1. Anne Mette Haas (editor of 29119-3) - Devo Team, Denmark
2. Annette Reilly - Lockheed Martin, USA
3. Arun Kumar Melkote - Wipro Technologies, India
4. Atsushi Mitomi - Hitachi, Japan
5. Barbara Huisman - Quality Business Solutions, Canada
6. Béatrix Barafort - Centre de Recherche Public Henri Tudor, Luxembourg
7. Cao Jing - Tianjin Software Testing Centre, China
8. Celestina Bianco - Systelab, Spain
9. Cerys Willoughby - IBM, UK
10. Chai Afeng - Tianjin Software Testing Centre, China
11. Cheong Jeong Seo - Samsung, Korea
12. Cheryl George - 2i, UK
13. Dietmar Gehring - UBS, Luxembourg
14. Dnyanada Wagh - Patni Computer Systems, India
15. Edward Bauer - US Department of Defense, USA
16. François Darphin - Sogeti, France
17. Garry Roedler - Lockheed Martin, USA
18. Grantham Daniels - South African Bureau of Standards, South Africa
19. Gustavo A Valencia R - GreenSQA, Columbia
20. Hack-Youp Noh - Korean Agency for Technology & Standards, Korea
21. Hareton Leung - Hong Kong Polytechnic University, Hong Kong
22. Ian Hirst - Birchgrove Technology Management Consulting, Australia
23. Ine Lutterman - Netherlands Standardization Institute, Netherlands
24. James Moore - MITRE, USA
25. Javier Tuya - University of Oviedo, Spain
26. Jean Louis Michel - Infocert, France
27. Jon Hagar - Lockheed Martin, USA
28. Jongkwan Lee - Software Testing Alliances, Korea
29. Juichi Takahashi - Sony Corporation, Japan
30. Kazuo Yabuta - Fujitsu, Japan
31. Keerthishankar K N - Wipro Technologies, India
32. Keum-Ran Lee - Software Testing Alliances, Korea
33. Klaudia Dussa-Zieger - Method Park Software AG, Germany
34. Kouichi Akiyama - Fuji Xerox, Japan
35. Kwangik Seo - Software Testing Alliances, South Korea
36. Leon Gerber - South Africa
37. Liliana Gómez Arenas - Parquesoft, Colombia
38. Manikandan K. - Bureau of Indian Standards, India
39. Mario Winter - imbus AG, Germany
40. Mariye Umay Akkaya - Turkish Standards Institution, Turkey
41. Mastura Abu Samah - Malaysian Software Testing Board, Malaysia
42. Matt Mansell - Department of Internal Affairs, New Zealand
43. Matthias Daigl - Koln University, Germany
44. Michael Crerar - Trusted Mission Solutions, USA
45. Moohee Han - LG Electronics, Korea
46. Nathalie van Delft - Capgemini, The Netherlands
47. Ogawa Kiyoshi - Nagoya Industrial Research Institute, Japan
48. Ola Perman - Tieto, Sweden
49. Ossi Taipale -Lappeenranta University of Technology, Finland
50. Patricia Huyos C. - Parquesoft, Columbia
51. Paula Maria Angeleri - National Standards Body of Argentina (IRAM), Argentina
52. Qin Liu - School of Software Engineering, Tongji UniversityChina
53. Radoslaw Hofman - Polsoft, Poland
54. Ricardo Cristalli - iteste, Brasil
55. Rolf Ziegler - SAP, Germany
56. Satomi Yoshizawa - NEC, Japan
57. Satoshi Masuda - IBM, Japan
58. Shinji Iwata - NTT Data Coorporation, Japan
59. Soo-yeon Lee - Korean Testing Laboratory, Korea
60. Steve Willsher - QualIT, New Zealand
61. Stuart Reid - British Standards Institution, United Kingdom
62. SuJin Choi - Software Testing Alliances, Korea
63. Susan Burgess - Keane, USA
64. Sylvia Veeraraghavan - Mind Tree, India
65. Tafline Murnane - K. J. Ross & Associates, Australia
66. Tan Liqin - China Electronics Standardization Institute (CESI), China
67. Theresa L. Hunt - NAVSEA, ASQ, USA
68. Thomas George - Wipro Technologies, India
69. Tim Archer - Charles Sturt University, Australia
70. Tohru Matsuodani - Hosei University, Japan
71. Ton van Bergeijk - Nederlands Normalisatie-instituut, Netherlands
72. Tsuneo Yamaura - Tokai University, Japan
73. Vijay Sampath - TCS, India
74. Wonil Kwon - Software Testing Alliances, South Korea
75. Yasuharu Nishi - University of Electro-Communications, Japan
76. Yuji Shinoki - Hitachi, Japan
77. Yumuto Tsuyoshi - Mamezou Co, Japan
78. Yu-Whoan Ahn - NEOPM, South Korea

WG26 at the SC7 interim meeting in Mumbai, India, November 2011

WG26 at the SC7 plenary in Niigata, Japan, May 2010

WG26 at the SC7 plenary meeting in Hyderabad, India, May 2009

Members of WG26 at the interim meeting in Seoul, South Korea, Nov 2008

Members of WG26 at the SC7 plenary in Berlin, Germany, May 2008